High-accuracy circuits for on-chip capacitor ratio testing and sensor readout by Bo Wang

Cover of: High-accuracy circuits for on-chip capacitor ratio testing and sensor readout | Bo Wang

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  • Analog-to-digital converters.,
  • Delta modulation.

Edition Notes

Book details

Statementby Bo Wang.
The Physical Object
Pagination135 leaves, bound :
Number of Pages135
ID Numbers
Open LibraryOL18126563M

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High-accuracy circuits for on-chip capacitor ratio testing and sensor readout. Download PDF (6 MB) Abstract. Graduation date: The precise measurement of a capacitance difference or ratio in a digital form is\ud very important for capacitive sensors, for CMOS process characterization as well as for the\ud realization of precise.

This paper presents a differential low-noise high-resolution switched-capacitor readout circuit that is intended for capacitive sensors. Amplitude modulation/demodulation and correlated double.

Capacitor bank design for wide tuning range LC VCOs: MHzGHz (%) on-chip capacitive ratio testing and sensor readout. CMOS switched-capacitor circuits for high-accuracy, on-chip.

where C 0 is the nominal capacitance at x 0, and x 0 is the gap between the plates or overlapping width of the plate, respectively.

It can be seen that decreasing x 0 can increase the sensitivity of the capacitive sensor. For typical geometries, the gap is much smaller than the overlap; thus, for high sensitivity capacitive displacement sensors, the variation in the plate gap is generally : Sha Xia, Stoyan Nihtianov.

In Fig.a parallel plate capacitive sensor is shown, the capacitance of which is a function of the gap and overlap between the two changes in both of the physical parameters can be used to sense displacement. In both cases, the sensitivity to a small displacement x is Boser (): d C d x = C 0 x 0 where C 0 is the nominal capacitance at x 0, and x 0 is the gap Author: Sha Xia, Stoyan Nihtianov.

“New High-Precision Circuits for On-Chip Capacitor Ratio Testing and Sensor Readout,” Proceedings, IEEE International. Symp. on Circuits and Systems, Vol. Symp. on Circuits and Systems, Vol. I, Monterey, CA, May June 3,pp.

VCC is given then the power led will lit. a capacitor is used to “High-Accuracy Circuits for On-chip Capacitive Ratio Testing and Sensor Readout”, IEEE Trans.

Instrum. & Meas., Feb.vol, no.1, pp. 16   Capacitive charge measurement. United States Patent Abstract: A circuit for measuring a High-accuracy circuits for on-chip capacitor ratio testing and sensor readout book charge comprises a latched comparator and a determination module.

Cao, Y. et al., “High Accuracy Circuits for On-Chip Capacitance Ratio Testing or Sensor Readout”, IEEE Transactions;vol. 41, No. 9., (Sep. ), This study proposes a front-end readout circuit as an encoder chip for magneto-resistance (MR) linear scales. A typical MR sensor consists of two major parts: one is its base structure, also called the magnetic scale, which is embedded with multiple grid MR electrodes, while another is an “MR reader” stage with magnets inside and moving on the rails of the by: 5.

Unless they are directly implemented on chip, the measurement errors will be high [24,25]. Other circuits in literature are sigma-delta modulation [26,27], dual slope [28,29], and phase shift circuit. The latter can provide an accurate measurement within a Author: Ahmed Fendri, Ahmed Yahia Kallel, Hanen Nouri, Hamadi Ghariani, Olfa Kanoun.

Bo, K. Tetsuya, S. Tao, and G. Temes, “High-accuracy circuits for onchip capacitive ratio testing and sensor readout,” IEEE Trans. Instr. and Meas., 47(1) () Google Scholar J. Kung and H. Lee, “An integrated air-gap-capacitor pressure sensor and digital readout with sub attfarad resolution,” IEEE J.

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